Accelerated Testing Statistical Models, Test Plans, and Data Analyses

dc.contributor.author	Nelson, Wayne
dc.date.accessioned	2019-01-24T11:38:30Z
dc.date.accessioned	2023-07-21T16:54:48Z
dc.date.available	2019-01-24T11:38:30Z
dc.date.available	2023-07-21T16:54:48Z
dc.date.issued	2004
dc.identifier.isbn	0-47 1-69736-2
dc.identifier.uri	http://10.215.13.25/handle/123456789/37414
dc.language.iso	en	en_US
dc.publisher	John Wiley & Sons, Ltd	en_US
dc.subject	Graphical Data Analysis	en_US
dc.title	Accelerated Testing Statistical Models, Test Plans, and Data Analyses	en_US
dc.type	Book	en_US