| dc.contributor.author | Echlin, Patrick | |
| dc.date.accessioned | 2019-07-26T08:37:40Z | |
| dc.date.accessioned | 2023-07-11T09:07:20Z | |
| dc.date.available | 2019-07-26T08:37:40Z | |
| dc.date.available | 2023-07-11T09:07:20Z | |
| dc.date.issued | 2009 | |
| dc.identifier.isbn | 978-0-387-85731-2 | |
| dc.identifier.uri | http://10.215.13.25/handle/123456789/77111 | |
| dc.language.iso | en | en_US |
| dc.publisher | Springer | en_US |
| dc.subject | Scanning Electron Microscopy and X-Ray Microanalysis | en_US |
| dc.title | Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis | en_US |
| dc.type | Book | en_US |