| dc.contributor.author | Reed, S. J. B. | |
| dc.date.accessioned | 2019-07-25T10:35:49Z | |
| dc.date.accessioned | 2023-07-11T09:06:27Z | |
| dc.date.available | 2019-07-25T10:35:49Z | |
| dc.date.available | 2023-07-11T09:06:27Z | |
| dc.date.issued | 2005 | |
| dc.identifier.isbn | 978-0-511-12542-3 | |
| dc.identifier.uri | http://10.215.13.25/handle/123456789/76925 | |
| dc.language.iso | en | en_US |
| dc.publisher | Cambridge | en_US |
| dc.subject | Electron Microprobe Analysis and Scanning Electron Microscopy in Geology | en_US |
| dc.title | Electron Microprobe Analysis and Scanning Electron Microscopy in Geology | en_US |
| dc.type | Book | en_US |